By M. Laing
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Extra resources for Introduction to the Scope, Power and Applications of X-ray Analysis [short article]
D e p e n d e n t ~ dependent ~ dependent reasonably independent of ~. * Can be extended to 50 ~ by use of ultra-thin windows. these are compared with the patterns of known compounds. Many thousand patterns have been recorded and published in the ASTM (JCPDS) Powder Diffraction File and these are available in subdivisions: Minerals, Inorganic, Organic. With experience, it is possible to identify the components in mixtures of up to three compounds. 0 o 0i75 0js0] 025] 0/ iMo c . 20 c r_,__ . . 25 30 35 .
Stout and Jensen, X-Ray Structure Determination, Macmillan, 1968. A. Taylor 2 A n introduction to the scope, potential and applications of X-ray analysis by M. C. WaUwork 4 The Reciprocal Lattice by A. Authier 5 Close-packed structures by P. Krishna and D. Pandey 6 Pourquoi les groupes de Symetrie en Cristallographie by D. Weigel 7 Solving the phase problem when heavy atoms are in special positions by L. Hohne and L. Kutchabsky 8 Anomolous Dispersion of X-rays in Crystallography by S. Caticha-Ellis 9 Rotation Matrices and Translation Vectors in Crystallography by S.
Iii) Diffraction" By far the most important industrial use of diffraction is through the powder technique. Typically this can be used for: Qualitative analysis The powder pattern of a sample is recorded, the d spacings (or 0 angles) and relative intensities of the 10 strongest lines are measured and 28 Table 4. Characteristics of counters Window Thickness Position Filling Pre-amplifier Auto-amplification Useful range (~) D e a d time (Micro seconds) Max. 2 10 -- 14 15 51 ~. d e p e n d e n t ~ dependent ~ dependent reasonably independent of ~.
Introduction to the Scope, Power and Applications of X-ray Analysis [short article] by M. Laing